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| MAX8796GTJ+ RELIABILITY REPORT FOR MAX8796GTJ+ PLASTIC ENCAPSULATED DEVICES March 18, 2009 MAXIM INTEGRATED PRODUCTS 120 SAN GABRIEL DR. SUNNYVALE, CA 94086 Approved by Ken Wendel Quality Assurance Director, Reliability Engineering Maxim Integrated Products. All rights reserved. Page 1/5 MAX8796GTJ+ Conclusion The MAX8796GTJ+ successfully meets the quality and reliability standards required of all Maxim products. In addition, Maxim"s continuous reliability monitoring program ensures that all outgoing product will continue to meet Maxim"s quality and reliability standards. Table of Contents I. ........Device Description II. ........Manufacturing Information III. .......Packaging Information .....Attachments I. Device Description A. General na V. ........Quality Assurance Information VI. .......Reliability Evaluation IV. .......Die Information Maxim Integrated Products. All rights reserved. Page 2/5 MAX8796GTJ+ II. Manufacturing Information A. Description/Function: B. Process: C. Number of Device Transistors: D. Fabrication Location: E. Assembly Location: F. Date of Initial Production: III. Packaging Information A. Package Type: B. Lead Frame: C. Lead Finish: D. Die Attach: E. Bondwire: F. Mold Material: G. Assembly Diagram: H. Flammability Rating: I. Classification of Moisture Sensitivity per JEDEC standard J-STD-020-C J. Single Layer Theta Ja: K. Single Layer Theta Jc: L. Multi Layer Theta Ja: M. Multi Layer Theta Jc: IV. Die Information A. Dimensions: B. Passivation: C. Interconnect: D. Backside Metallization: E. Minimum Metal Width: F. Minimum Metal Spacing: G. Bondpad Dimensions: H. Isolation Dielectric: I. Die Separation Method: 77 X 73 mils Si3N4/SiO2 (Silicon nitride/ Silicon dioxide Aluminum/Si (Si = 1%) None Metal1 = 0.5 / Metal2 = 0.6 / Metal3 = 0.6 microns (as drawn) Metal1 = 0.45 / Metal2 = 0.5 / Metal3 = 0.6 microns (as drawn) 5 mil. Sq. SiO2 Wafer Saw 32-pin TQFN 5x5 Copper 100% matte Tin Conductive Epoxy Gold (1 mil dia.) Epoxy with silica filler #05-9000-2634 Class UL94-V0 Level 1 47C/W 1.7C/W 29C/W 2.7C/W Single-Phase Quick-PWM Intel IMVP6/6+/GMCH Controller S4 10146 Texas UTL Thailand December 19, 2007 Maxim Integrated Products. All rights reserved. Page 3/5 MAX8796GTJ+ V. Quality Assurance Information A. Quality Assurance Contacts: Ken Wendel (Director, Reliability Engineering) Bryan Preeshl (Managing Director of QA) 0.1% for all electrical parameters guaranteed by the Datasheet. 0.1% For all Visual Defects. < 50 ppm Mil-Std-105D B. Outgoing Inspection Level: C. Observed Outgoing Defect Rate: D. Sampling Plan: VI. Reliability Evaluation A. Accelerated Life Test The results of the 135C biased (static) life test are shown in Table 1. Using these results, the Failure Rate ( ) is calculated as follows: = 1 MTTF = 1.83 (Chi square value for MTTF upper limit) 192 x 4340 x 192 x 2 (where 4340 = Temperature Acceleration factor assuming an activation energy of 0.8eV) = 5.6 x 10 -9 = 5.6 F.I.T. (60% confidence level @ 25C) The following failure rate represents data collected from Maxim's reliability monitor program. Maxim performs quarterly 1000 hour life test monitors on its processes. This data is published in the Product Reliability Report found at http://www.maximic.com/. Current monitor data for the S4 Process results in a FIT Rate of 0.28 @ 25C and 4.85 @ 55C (0.8 eV, 60% UCL) B. Moisture Resistance Tests The industry standard 85C/85%RH or HAST testing is monitored per device process once a quarter. C. E.S.D. and Latch-Up Testing The PE11 die type has been found to have all pins able to withstand a HBM transient pulse of +/-300 V per JEDEC JESD22-A114-D. Latch-Up testing has shown that this device withstands a current of +/-250 mA. Maxim Integrated Products. All rights reserved. Page 4/5 MAX8796GTJ+ Table 1 Reliability Evaluation Test Results MAX8796GTJ+ TEST ITEM TEST CONDITION FAILURE IDENTIFICATION SAMPLE SIZE NUMBER OF FAILURES Static Life Test (Note 1) Ta = 135C Biased Time = 192 hrs. Moisture Testing (Note 2) 85/85 Ta = 85C RH = 85% Biased Time = 1000hrs. DC Parameters & functionality 192 0 DC Parameters & functionality 77 0 Mechanical Stress (Note 2) Temperature -65C/150C Cycle 1000 Cycles Method 1010 DC Parameters & functionality 77 0 Note 1: Life Test Data may represent plastic DIP qualification lots. Note 2: Generic Package/Process data Maxim Integrated Products. All rights reserved. Page 5/5 |
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